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Proceedings Paper

CdTe and Cd0.9Zn0.1Te crystal growth and characterization for nuclear spectrometers
Author(s): Krishna C. Mandal; Sung Hoon Kang; Michael Choi; Gomez Wright; Gerald E. Jellison
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Paper Abstract

Large volume single crystals of CdTe and Cd0.9Zn0.1Te (CZT) have been grown by a controlled vertical Bridgman technique using in-house zone refined precursors and characterized through structural, electrical, optical, and spectroscopic methods. The grown crystals (diameter greater than or equal to 2.5 cm and length >10 cm) have shown promising characteristics for high-resolution room temperature solid-state radiation detectors due to their high resistivity (~1010 Ω-cm for CdTe, and >1011 Ω-cm for CZT) and good charge transport properties [μτe ~ (2-5)x10-3 cm2/V]. The fabricated detectors in planar single element and Frisch collar configurations have shown very low leakage currents and high count rates for various sources, including Am-241, and Cs-137. The grown crystals have been further characterized by X-ray diffraction (XRD), infrared spectroscopy (IR), and transmission two-modulator generalized ellipsometry (2-MGE). Details of the CdTe and CZT characterization results, detector fabrication steps, and testing with radiation sources are presented. The CdTe and CZT crystals have shown high prospects for low power rating solid-state nuclear spectrometers and medical imaging devices.

Paper Details

Date Published: 14 September 2006
PDF: 10 pages
Proc. SPIE 6319, Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII, 63190X (14 September 2006); doi: 10.1117/12.683802
Show Author Affiliations
Krishna C. Mandal, EIC Labs., Inc. (United States)
Sung Hoon Kang, EIC Labs., Inc. (United States)
Michael Choi, EIC Labs., Inc. (United States)
Gomez Wright, Oak Ridge National Lab. (United States)
Gerald E. Jellison, Oak Ridge National Lab. (United States)

Published in SPIE Proceedings Vol. 6319:
Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII
F. Patrick Doty; Larry A. Franks; Arnold Burger; H. Bradford Barber; Hans Roehrig; Ralph B. James, Editor(s)

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