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Proceedings Paper

Image processing in optic damage inspection of dark-field imaging
Author(s): Zhi-hong Sun; Zhi-tao Peng; Hua Liu; Ya-ping Xie; Feng Jing; Deng-sheng Wu
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Paper Abstract

Damage inspection of the large aperture components is required for Large, high-power laser systems. Dark-field imaging technology is used to enhance resolution of defects. Because there are several of the optics which are laid with Brewster angle in optics online inspection and the image collected by CCD includes many noises, so the image are quite complex. A kind of image processing method is introduced, which is based on classical method about edge detection. Gray restrain is used and the relations between the pixel and its eight neighbours are considered in calculating the gradient. The defect size is measured and damage defect of optics is analyzed using the image processing methodology. The new approach produces nice result.

Paper Details

Date Published: 7 September 2006
PDF: 7 pages
Proc. SPIE 6294, Infrared and Photoelectronic Imagers and Detector Devices II, 62940D (7 September 2006); doi: 10.1117/12.683188
Show Author Affiliations
Zhi-hong Sun, Research Ctr. of Laser Fusion (China)
Zhi-tao Peng, Research Ctr. of Laser Fusion (China)
Hua Liu, Research Ctr. of Laser Fusion (China)
Ya-ping Xie, Research Ctr. of Laser Fusion (China)
Feng Jing, Research Ctr. of Laser Fusion (China)
Deng-sheng Wu, Research Ctr. of Laser Fusion (China)


Published in SPIE Proceedings Vol. 6294:
Infrared and Photoelectronic Imagers and Detector Devices II
Randolph E. Longshore; Ashok Sood, Editor(s)

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