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Proceedings Paper

Radiation-induced loss predictions for pure silica core polarization-maintaining fibers
Author(s): Michael J. Lu Valle; E. Joseph Friebele; Frank V. Dimarcello; Gary A. Miller; Eric M. Monberg; Lucie R. Wasserman; Patrick W. Wisk; Man F. Yan; Elizabeth M. Birtch
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Paper Abstract

We examined the room temperature radiation-induced optical attenuation of silica-core, polarization-maintaining fibers with boron stress rods. The fibers were exposed to 55 MeV protons to equivalent doses between 100 krad and 1 Mrad at dose rates of 2 to 100 rad/s. Spectra from 1250-1725 nm were recorded during both exposure and ~2,800 h recovery. The spectral response over time indicates two separate populations of defects that affect loss. Explicit kinetic modeling indicates that the growth of the induced loss is consistent with a power law in dose rate, and recovery is consistent with low (1st or 2nd) order annealing with a distribution of activation energies and a single attempt frequency for each population. For predicting the radiation-induced loss in exposure conditions of much lower dose rate and much longer time, our theory and numerical simulations indicate that the best experiments for reducing risk in our extrapolations include higher temperature anneals, and, unavoidably, longer exposures at lower dose rate.

Paper Details

Date Published: 24 May 2006
PDF: 12 pages
Proc. SPIE 6193, Reliability of Optical Fiber Components, Devices, Systems, and Networks III, 61930J (24 May 2006); doi: 10.1117/12.682973
Show Author Affiliations
Michael J. Lu Valle, OFS Labs. (United States)
E. Joseph Friebele, Naval Research Lab. (United States)
Frank V. Dimarcello, OFS Labs. (United States)
Gary A. Miller, Naval Research Lab. (United States)
Eric M. Monberg, OFS Labs. (United States)
Lucie R. Wasserman, Naval Reseach Lab. (United States)
SFA, Inc. (United States)
Patrick W. Wisk, OFS Labs. (United States)
Man F. Yan, OFS Labs. (United States)
Elizabeth M. Birtch, Naval Research Lab. (United States)
Alfred Univ. (United States)


Published in SPIE Proceedings Vol. 6193:
Reliability of Optical Fiber Components, Devices, Systems, and Networks III
Hans G. Limberger; M. John Matthewson, Editor(s)

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