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Proceedings Paper

High spatial-resolution imaging of Te inclusions in CZT material
Author(s): G. S. Camarda; A. E. Bolotnikov; G. A. Carini; Y. Cui; K. T. Kohman; L. Li; R. B. James
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Paper Abstract

We present new results from our studies of defects in current single-crystal CdZnTe material. Our previous measurements, carried out on thin (~1 mm) and long (>12 mm) CZT detectors, indicated that small (1-20 μm) Te inclusions can significantly degrade the device's energy resolution and detection efficiency. We are conducting detailed studies of the effects of Te inclusions by employing different characterization techniques with better spatial resolution, such as quantitative fluorescence mapping, X-ray micro-diffraction, and TEM. Also, IR microscopy and gamma-mapping with pulse-shape analysis with higher spatial resolution generated more accurate results in the areas surrounding the micro-defects (Te inclusions). Our results reveal how the performance of CdZnTe detectors is influenced by Te inclusions, such as their spatial distribution, concentration, and size. We also discuss a model of charge transport through areas populated with Te inclusions.

Paper Details

Date Published: 21 September 2006
PDF: 6 pages
Proc. SPIE 6319, Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII, 63190Z (21 September 2006); doi: 10.1117/12.682720
Show Author Affiliations
G. S. Camarda, Brookhaven National Lab. (United States)
A. E. Bolotnikov, Brookhaven National Lab. (United States)
G. A. Carini, Brookhaven National Lab. (United States)
Y. Cui, Brookhaven National Lab. (United States)
K. T. Kohman, Kansas State Univ. (United States)
L. Li, Yinnel Tech, Inc. (United States)
R. B. James, Brookhaven National Lab. (United States)

Published in SPIE Proceedings Vol. 6319:
Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII
F. Patrick Doty; Larry A. Franks; Arnold Burger; H. Bradford Barber; Hans Roehrig; Ralph B. James, Editor(s)

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