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Proceedings Paper

Recent experiments in trapped-ion quantum information processing at NIST
Author(s): J. Chiaverini; M. D. Barrett; R. B. Blakestad; J. Britton; W. M. Itano; J. D. Jost; E. Knill; C. Langer; D. Leibfried; R. Ozeri; T. Schaetz; D. J. Wineland
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Paper Abstract

Atomic ions confined in segmented trap arrays provide a system for quantum information processing. We report on the execution of two simple quantum algorithms, quantum error correction and the quantum Fourier transform, using this implementation. The demonstration of these algorithms in a scalable system is one step towards the execution of useful, large-scale quantum algorithms.

Paper Details

Date Published: 22 May 2006
PDF: 12 pages
Proc. SPIE 6256, ICONO 2005: Ultrafast Phenomena and Physics of Superintense Laser Fields; Quantum and Atom Optics; Engineering of Quantum Information, 625610 (22 May 2006); doi: 10.1117/12.682633
Show Author Affiliations
J. Chiaverini, National Institute of Standards and Technology (United States)
M. D. Barrett, National Institute of Standards and Technology (United States)
R. B. Blakestad, National Institute of Standards and Technology (United States)
J. Britton, National Institute of Standards and Technology (United States)
W. M. Itano, National Institute of Standards and Technology (United States)
J. D. Jost, National Institute of Standards and Technology (United States)
E. Knill, National Institute of Standards and Technology (United States)
C. Langer, National Institute of Standards and Technology (United States)
D. Leibfried, National Institute of Standards and Technology (United States)
R. Ozeri, National Institute of Standards and Technology (United States)
T. Schaetz, National Institute of Standards and Technology (United States)
D. J. Wineland, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 6256:
ICONO 2005: Ultrafast Phenomena and Physics of Superintense Laser Fields; Quantum and Atom Optics; Engineering of Quantum Information
Hans A. Bachor; Andre D. Bandrauk; Paul B. Corkum; Markus Drescher; Mikhail Fedorov; Serge Haroche; Sergei Kilin; Alexander Sergienko, Editor(s)

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