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Proceedings Paper

Delta-doped high purity silicon UV-NIR CCDs with high QE and low dark current
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Proc. SPIE 6294, Infrared and Photoelectronic Imagers and Detector Devices II, 629408; doi: 10.1117/12.682486
Show Author Affiliations
Michael E. Hoenk, Jet Propulsion Lab. (United States)
Jordana Blacksberg, Jet Propulsion Lab. (United States)
Shouleh Nikzad, Jet Propulsion Lab. (United States)
Tom S. Elliott, QinetiQ (United Kingdom)
Stephen E. Holland, Lawrence Berkeley National Lab. (United States)
Christopher J. Bebek, Lawrence Berkeley National Lab. (United States)
Paul A. Scowen, Arizona State Univ. (United States)
Todd Veach, Arizona State Univ. (United States)


Published in SPIE Proceedings Vol. 6294:
Infrared and Photoelectronic Imagers and Detector Devices II
Randolph E. Longshore; Ashok Sood, Editor(s)

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