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Proceedings Paper

Closed-loop adaptive optics using a CMOS image quality metric sensor
Author(s): Chueh Ting; Aditya Rayankula; Michael K. Giles; Paul M. Furth
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Paper Abstract

When compared to a Shack-Hartmann sensor, a CMOS image sharpness sensor has the advantage of reduced complexity in a closed-loop adaptive optics system. It also has the potential to be implemented as a smart sensor using VLSI technology. In this paper, we present a novel adaptive optics testbed that uses a CMOS sharpness imager built in the New Mexico State University (NMSU) Electro-Optics Research Laboratory (EORL). The adaptive optics testbed, which includes a CMOS image quality metric sensor and a 37-channel deformable mirror, has the capability to rapidly compensate higher-order phase aberrations. An experimental performance comparison of the pinhole image sharpness feedback method and the CMOS imager is presented. The experimental data shows that the CMOS sharpness imager works well in a closed-loop adaptive optics system. Its overall performance is better than that of the pinhole method, and it has a fast response time.

Paper Details

Date Published: 29 August 2006
PDF: 9 pages
Proc. SPIE 6306, Advanced Wavefront Control: Methods, Devices, and Applications IV, 63060C (29 August 2006); doi: 10.1117/12.682274
Show Author Affiliations
Chueh Ting, New Mexico State Univ. (United States)
Aditya Rayankula, New Mexico State Univ. (United States)
Michael K. Giles, New Mexico State Univ. (United States)
Paul M. Furth, New Mexico State Univ. (United States)


Published in SPIE Proceedings Vol. 6306:
Advanced Wavefront Control: Methods, Devices, and Applications IV
Michael K. Giles; John D. Gonglewski; Richard A. Carreras, Editor(s)

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