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Proceedings Paper

Optical constants determination of neodymium and gadolinium in the 3- to 100-nm wavelength range
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Paper Abstract

The optical constants (n, k) of the wavelength-dependent index of refraction N = n+ik = 1-δ+ik of Nd (Neodymium) and Gd (Gadolinium) are determined in the wavelength range of 3 nm to 100 nm by the transmittance method using synchrotron radiation. Nd and Gd films with thicknesses ranging from 5 nm to 180 nm were fabricated on Si photodiodes (which served as the coating substrates as well as the detectors) and capped with Si layers to protect these reactive rare earth elements from oxidation. The imaginary part (k) obtained directly from the transmittance measurement is used in the derivation of the real part (δ) of the complex index of refraction N through the Kramers- Kronig integral. The measured optical constants are used in the design of currently developed Nd- and Gd-based multilayers for solar imaging applications. Our results on Nd and Gd optical constants and the reflectance of some Nd- and Gd-based multilayers are presented.

Paper Details

Date Published: 29 August 2006
PDF: 6 pages
Proc. SPIE 6317, Advances in X-Ray/EUV Optics, Components, and Applications, 63170U (29 August 2006); doi: 10.1117/12.681952
Show Author Affiliations
B. Kjornrattanawanich, Brookhaven National Lab. (United States)
D. L. Windt, Reflective X-ray Optics LLC (United States)
Y. A. Uspenskii, Lebedev Physical Institute (Russia)
J. F. Seely, Naval Research Lab. (United States)


Published in SPIE Proceedings Vol. 6317:
Advances in X-Ray/EUV Optics, Components, and Applications
Ali M. Khounsary; Christian Morawe, Editor(s)

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