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Proceedings Paper

System level approach to satellite instrument calibration
Author(s): Joseph J. Tansock; Alan Thurgood; Gail Bingham; Nikita Pougatchev; Randy Jost; Raju U. Datla; E. Knight; Victor Privalsky; Vladimir Krutikov; Vyacheslav Ivanov; Victor Sapritsky; Alexander Panfilov
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Paper Abstract

The state-of-the-art electro-optical sensors being designed for today's space-based environmental applications require a complete characterization and thorough calibration. This is especially true for sensors designed to assess global climate change, which require very small uncertainties. This paper describes a system-level approach that addresses each phase of calibration, from planning to on-orbit operations. This approach encourages early planning and continuity of effort throughout the lifetime of the project (pre- and post-flight) to promote an optimum calibration approach that will minimize uncertainty for the intended application. This paper also discusses considerations for component level characterization, ground calibration and standards, in-flight calibration sources and trending, and in-flight validation assessment.

Paper Details

Date Published: 1 September 2006
PDF: 8 pages
Proc. SPIE 6301, Atmospheric and Environmental Remote Sensing Data Processing and Utilization II: Perspective on Calibration/Validation Initiatives and Strategies, 630103 (1 September 2006); doi: 10.1117/12.681933
Show Author Affiliations
Joseph J. Tansock, Utah State Univ. (United States)
Alan Thurgood, Utah State Univ. (United States)
Gail Bingham, Utah State Univ. (United States)
Nikita Pougatchev, Utah State Univ. (United States)
Randy Jost, Utah State Univ. (United States)
Raju U. Datla, National Institute of Standards and Technology (United States)
E. Knight, Ball Aerospace & Technologies Corp. (United States)
Victor Privalsky, Vega International, Inc. (United States)
Vladimir Krutikov, Federal Agency on Technical Regulating and Metrology (Russia)
Vyacheslav Ivanov, All-Russian Institute for Opto-Physical Measurements (Russia)
Victor Sapritsky, All-Russian Institute for Opto-Physical Measurements (Russia)
Alexander Panfilov, All-Russian Institute for Opto-Physical Measurements (Russia)


Published in SPIE Proceedings Vol. 6301:
Atmospheric and Environmental Remote Sensing Data Processing and Utilization II: Perspective on Calibration/Validation Initiatives and Strategies
Allen H. L. Huang; Hal J. Bloom, Editor(s)

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