Share Email Print

Proceedings Paper

Simplified spectropolarimetry using reactive mesogen polarization gratings
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The measurement of complete polarimetric parameters for a broad spectrum of wavelengths is challenging because of the multi-dimensional nature of the data and the need to chromatically separate the light under test. As a result, current methods for spectropolarimetry and imaging polarimetry are limited because they tend to be complex and/or relatively slow. Here we experimentally demonstrate an approach to measure all four Stokes parameters using three polarization gratings and four simultaneous intensity measurements, with potential to dramatically impact the varied fields of air/space-borne remote sensing, target detection, biomedical imaging/diagnosis, and telecommunications. We have developed reactive mesogen polarization gratings using simple spin-casting and holography techniques, and used them to implement a potentially revolutionary detector capable of simultaneous measurement of full polarization information at many wavelengths with no moving or tunable elements. This polarimeter design not only enables measurements over a likely bandwidth of up to 70% of the center wavelength, it is also capable of measurements at relatively high speed (MHz or more) limited only by the choice of photo-detectors and processing power of the system. The polarization gratings themselves manifest nearly ideal behavior, including diffraction efficiencies of greater than 99%, strong polarization sensitivity of the first diffraction orders, very low incoherent scattering, and suitability for visible and infrared light. Due to its simple and compact design, simultaneous measurement process, and potential for preserving image registration, this spectropolarimeter should prove an attractive alternative to current polarization detection and imaging systems.

Paper Details

Date Published: 1 September 2006
PDF: 11 pages
Proc. SPIE 6302, Imaging Spectrometry XI, 630207 (1 September 2006); doi: 10.1117/12.681447
Show Author Affiliations
Michael J. Escuti, North Carolina State Univ. (United States)
Chulwoo Oh, North Carolina State Univ. (United States)
Carlos Sánchez, Univ. de Zaragoza (Spain)
Cees Bastiaansen, Eindhoven Univ. of Technology (Netherlands)
Dirk J. Broer, Eindhoven Univ. of Technology (Netherlands)
Philips Research Labs. (Netherlands)

Published in SPIE Proceedings Vol. 6302:
Imaging Spectrometry XI
Sylvia S. Shen; Paul E. Lewis, Editor(s)

© SPIE. Terms of Use
Back to Top