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Proceedings Paper

A comparison of a generalized DEI method with multiple-image radiography
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Paper Abstract

Diffraction enhanced imaging (DEI) is an analyzer-based X-ray phase-contrast imaging method that measures the absorption and refractive properties of an object. A well-known limitation of DEI is that it does not account for ultra-small-angle X-ray scattering (USAXS), which is produced commonly by biological tissue. In this work, an extended DEI (E-DEI) imaging method is described that attempts to circumvent this limitation. The EDEI method concurrently reconstructs three images that depict an object's projected absorption, refraction, and USAXS properties, and can be viewed as an implementation of the multiple-image radiography (MIR) paradigm. Planar and computed tomography (CT) implementations of E-DEI and an existing MIR method are compared by use of computer-simulation studies that employ statistical models to describe USAXS effects.

Paper Details

Date Published: 7 September 2006
PDF: 8 pages
Proc. SPIE 6318, Developments in X-Ray Tomography V, 631819 (7 September 2006); doi: 10.1117/12.681203
Show Author Affiliations
Cheng-Ying Chou, Illinois Institute of Technology (United States)
Mark A. Anastasio, Illinois Institute of Technology (United States)
Jovan G. Brankov, Illinois Institute of Technology (United States)
Miles N. Wernick, Illinois Institute of Technology (United States)

Published in SPIE Proceedings Vol. 6318:
Developments in X-Ray Tomography V
Ulrich Bonse, Editor(s)

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