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Proceedings Paper

Determination of the transmittance and extinction coefficient of Yb films in the 23-1700 eV range
Author(s): Juan I. Larruquert; Mónica Fernández-Perea; José A. Aznárez; José A. Méndez; Luca Poletto; Denis Garoli; A. Marco Malvezzi; Angelo Giglia; Stefano Nannarone
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Paper Abstract

The transmittance of thin films of Yb deposited by evaporation in ultra high vacuum (UHV) conditions have been investigated in the 23-1,700 eV spectral range. Transmittance measurements were performed in situ on Yb films deposited over grids coated with a thin, C support film. Transmittance measurements were used to obtain the extinction coefficient of Yb films at each individual photon energy investigated. The energy range investigated encompasses M, N, and O edges of Yb. The current results, along with data in the literature, show that Yb has an interesting low-absorption band in the ~12-24 eV range. The promising characteristics of Yb as a filter material in this region requires the development of a protection material due to the reactivity of Yb under normal atmosphere. The low absorption of Yb in the above range makes it also a candidate for a component of multilayer coatings in a spectral region in which few developments have been performed due to the lack of low absorption materials. The fl sum-rule was applied to extinction coefficient data in the whole spectrum that included the current data along with those of the literature, resulting in a value of 70.26, which is close to the expected value of 69.32.

Paper Details

Date Published: 21 September 2006
PDF: 12 pages
Proc. SPIE 6317, Advances in X-Ray/EUV Optics, Components, and Applications, 63170S (21 September 2006); doi: 10.1117/12.680930
Show Author Affiliations
Juan I. Larruquert, Instituto de Física Aplicada, Consejo Superior de Investigaciones Científicas (Spain)
Mónica Fernández-Perea, Instituto de Física Aplicada, Consejo Superior de Investigaciones Científicas (Spain)
José A. Aznárez, Instituto de Física Aplicada, Consejo Superior de Investigaciones Científicas (Spain)
José A. Méndez, Instituto de Física Aplicada, Consejo Superior de Investigaciones Científicas (Spain)
Luca Poletto, Istituto Nazionale per la Fisica della Materia, CNR (Italy)
Dept. of Information Engineering (Italy)
Denis Garoli, Istituto Nazionale per la Fisica della Materia, CNR (Italy)
Dept. of Information Engineering (Italy)
A. Marco Malvezzi, Univ. di Pavia (Italy)
Istituto Nazionale per la Fisica della Materia (Italy)
Angelo Giglia, TASC, Istituto Nazionale per la Fisica della Materia, CNR (Italy)
Stefano Nannarone, TASC, Istituto Nazionale per la Fisica della Materia, CNR (Italy)


Published in SPIE Proceedings Vol. 6317:
Advances in X-Ray/EUV Optics, Components, and Applications
Ali M. Khounsary; Christian Morawe, Editor(s)

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