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Proceedings Paper

Sedimentations on high-precision surfaces of advanced materials by magnetorheological finishing
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Paper Abstract

Magnetorheological finishing (MRF) is a computer controlled polishing (CCP) technique for high precision surfaces. The process uses a magnetorheological fluid which stiffens in a magnetic field and thus acts as the polishing tool. A standard MR fluid consists of magnetic carbonyl iron (CI) particles, nonmagnetic polishing abrasives and liquid. To delaying oxidation of the iron particles and avoiding agglomeration the liquid consists of water completed with stabilizers. For the material removal and smoothing of the surface mostly cerium oxide or diamond is used. The materials to be polished may tend toward to different sedimentations of the MR fluid on the machined surface. These sedimentations result from the machining and may develop a polishing layer with MR fluid components. At the University of Applied Sciences Deggendorf analysis of the machined surface are made by the scanning electronic microscope (SEM) to determine the sedimentations of the finishing. The results of the research display the influence for the surface properties due to developing polishing layer by magnetorheological finishing.

Paper Details

Date Published: 15 September 2006
PDF: 10 pages
Proc. SPIE 6288, Current Developments in Lens Design and Optical Engineering VII, 62880R (15 September 2006); doi: 10.1117/12.680247
Show Author Affiliations
Andreas Geiss, Univ. of Applied Sciences Deggendorf (Germany)
Alexander Dubcek Univ. of Trencin (Slovak Republic)
Markus Schinhaerl, Univ. of Applied Sciences Deggendorf (Germany)
Elmar Pitschke, Univ. of Applied Sciences Deggendorf (Germany)
Rolf Rascher, Univ. of Applied Sciences Deggendorf (Germany)
Peter Sperber, Univ. of Applied Sciences Deggendorf (Germany)
Juraj Slabeycius, Alexander Dubcek Univ. of Trencin (Slovak Republic)


Published in SPIE Proceedings Vol. 6288:
Current Developments in Lens Design and Optical Engineering VII
Pantazis Z. Mouroulis; Warren J. Smith; R. Barry Johnson, Editor(s)

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