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Proceedings Paper

Ultrafast optical nonlinearities of metal nanoparticles: single-particle measurements and correlation to structure
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Paper Abstract

We have measured nonlinear scattering from plasmons in individual Au nanorods and have correlated second-harmonic activity of Ag nanoparticles and clusters to morphology. The measurements reveal novel ultrafast nonlinear phenomena related to electron confinement. Surprisingly, the coherent plasmon response is suppressed relative to the hot electron response indicating enhanced plasmon dephasing. In a parallel set of studies we demonstrate nanometer scale localization of the nonlinear optical response of single nanoparticles and aggregates and correlate this with their morphology. Position markers are fabricated on an optical and electron-transparent substrate (Si3N4 thin film) that allows optical measurements and transmission electron microscopy (TEM) imaging of the identical nanoparticles or aggregates. The second harmonic (SH) activity optical image of individual Ag nanostructures is registered with the TEM image. Centroid localization of the optical signals allows correlation with better than 25 nm precision. This is sufficient to determine the origin of optical "hot spots" within multi-particle aggregates.

Paper Details

Date Published: 14 September 2006
PDF: 6 pages
Proc. SPIE 6323, Plasmonics: Metallic Nanostructures and their Optical Properties IV, 632309 (14 September 2006); doi: 10.1117/12.680151
Show Author Affiliations
Norbert F. Scherer, The Univ. of Chicago (United States)
Matthew Pelton, The Univ. of Chicago (United States)
Rongchao Jin, The Univ. of Chicago (United States)
Justin E. Jureller, The Univ. of Chicago (United States)
Mingzhao Liu, The Univ. of Chicago (United States)
Hee Y. Kim, The Univ. of Chicago (United States)
Sungnam Park, The Univ. of Chicago (United States)
Philippe Guyot-Sionnest, The Univ. of Chicago (United States)


Published in SPIE Proceedings Vol. 6323:
Plasmonics: Metallic Nanostructures and their Optical Properties IV
Mark I. Stockman, Editor(s)

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