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Proceedings Paper

Peculiarities of the formation of the mirror component by rough surface
Author(s): Mykhaylo Yu. Sakhnovskiy; Myroslav T. Strynadko; Bogdan M. Tymochko
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Paper Abstract

It's investigated the formation principles of the mirrored polarized radiation by rough surface on the model basis of statistically oriented micro flats with distinctive distribution of their altitudes and slope angles. Mirror component is formed as the result of waves' interference that are reflected from the statistically oriented micro flats, which normals assign solid angle and responds to the first diffracting speck. We'll receive normalized Mueller matrix of mirror reflection for the isotropic rough surface, integrating Jones vector of the average statistical micro flat within the limits of the first diffracting speck. It is typical that there is no beam depolarization for the mirror component. Complying with certain conditions we'll receive the situation when the reflected beam intensity of p-polarization for rough surface predominates the corresponding value for the polished one in pan angles. This effect is especially visualized in the field of the working hade. It can be explained on the ground of two phenomena: change of the effective refraction coefficient of the reflecting surface due to the microscopic defects and interference from the statistically oriented micro flats of the distinctive size, that is larger than wave length. At the same time intensity of scomponent in the reflected beam from rough surface is always lower than correspondent value for the polished one.

Paper Details

Date Published: 14 June 2006
PDF: 4 pages
Proc. SPIE 6254, Seventh International Conference on Correlation Optics, 62540T (14 June 2006); doi: 10.1117/12.679927
Show Author Affiliations
Mykhaylo Yu. Sakhnovskiy, Chernivtsi National Univ. (Ukraine)
Myroslav T. Strynadko, Chernivtsi National Univ. (Ukraine)
Bogdan M. Tymochko, Chernivtsi National Univ. (Ukraine)

Published in SPIE Proceedings Vol. 6254:
Seventh International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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