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Proceedings Paper

Nanometer movements detection by back focal plane interference in laser tweezers
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Paper Abstract

Small displacements of a microparticle in an optical trap can be measured using back focal plane interferometry. The position of the particle is evaluated by analyzing the fringes pattern obtained by interference between the light scattered by the particle and unscaterred light in the back focal plane of the condenser. The fringes positions are detected with a quadrant photo diode, allowing nanometric precision. In this paper we analyze theoretically some parameters that may influence the measurements: laser power fluctuations, local fluid viscosity, condenser focal length, particle size.

Paper Details

Date Published: 14 June 2006
PDF: 5 pages
Proc. SPIE 6254, Seventh International Conference on Correlation Optics, 62540B (14 June 2006); doi: 10.1117/12.679908
Show Author Affiliations
Monica Nadasan, Politehnica Univ. of Bucharest (Romania)
Revati Kulkarni, International Institute of Information Technology (India)
Ovidiu Iancu, Politehnica Univ. of Bucharest (Romania)


Published in SPIE Proceedings Vol. 6254:
Seventh International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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