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Proceedings Paper

Micro-CT of small insects by projection x-ray microscopy
Author(s): Akira Tanisako; Susumu Tsuruta; Ayumi Hori; Aya Okumura; Chikara Miyata; Chiaki Kuzuryu; Takashi Obi; Hideyuki Yoshimura
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Paper Abstract

The projection X-ray microscope utilized a very small X-ray source emitted from a thin (0.1-3 μm) target metal film excited by the focused electron beam of a scanning electron microscope (SEM). When an object is placed just below the target metal film, the diverging X-rays enlarge the shadow of the object. Because no X-ray optics such as a zone-plate is used, the focal depth is, in principle, infinitely large. We exploited this to apply projection X-ray microscopy to three-dimensional (3-D) structure analysis by means of cone-beam computed tomography (CT). A small arthropod (Pseudocneorhinus bifasciatus, 5 mm in length) was examined for CT study. The projection images were recorded at 3-degree increments over the whole range (360°) of a stepping-motor-controlled sample rotator. The 3-D reconstructed image was calculated to be 256 x 256 x 256 (5 μm) voxel data. The reconstructed 3-D image showed in detail the internal structure of an opaque object. Trial for element mapping using projection X-ray microscope is also performed by developing a new target exchanger. This apparatus enables exchange of metal targets without leaking vacuum of SEM. By taking images using Kα line from nickel and cobalt targets, distribution of iron, which has absorption edge between two Kα lines, can be shown. Distribution of less than 10 μm iron particles is distinguished from cobalt particles. This system would be applicable for 3-D element analysis.

Paper Details

Date Published: 7 September 2006
PDF: 8 pages
Proc. SPIE 6318, Developments in X-Ray Tomography V, 63180B (7 September 2006); doi: 10.1117/12.679780
Show Author Affiliations
Akira Tanisako, Meiji Univ. (Japan)
Susumu Tsuruta, Meiji Univ. (Japan)
Ayumi Hori, Meiji Univ. (Japan)
Aya Okumura, Meiji Univ. (Japan)
Chikara Miyata, Meiji Univ. (Japan)
Chiaki Kuzuryu, Meiji Univ. (Japan)
Takashi Obi, Tokyo Institute of Technology (Japan)
Hideyuki Yoshimura, Meiji Univ. (Japan)

Published in SPIE Proceedings Vol. 6318:
Developments in X-Ray Tomography V
Ulrich Bonse, Editor(s)

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