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Proceedings Paper

Inelastic scattering measurements of low-energy x-ray photons by organics, soil, water, and metals
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Paper Abstract

The angular distribution of the inelastic scattering of photons at low energies (≤80 KeV) has been measured in organic material, soil, rocks, wood, steel sheet, and water. The measurements have been performed under air inside an X-ray shield cabinet using X-rays tube as a photon source and a thermoelectrically cooled CdTe detector. Measurements have been taken for both single and combined materials. The contributions of inelastic scattering of photons for the lower Z material in a given configuration have been extracted. The measured signal is primarily Compton scattering. The measured inelastic scattering contributions were compared with the calculated inelastic scattering cross sections according to the Klein-Nishina theory, updated to include a practical energy distribution of an X-ray tube beam. Relatively good agreement was found for all targets under investigation. The slight discrepancy is attributed to photoelectric effect and sample configuration. Present results may act as a guide for optimization of X-ray imaging sensors and in particular of those based on lobster eye X-ray optics suitable for cargo inspection, improvised explosives detection, non-destructive evaluation, and medical imaging.

Paper Details

Date Published: 30 August 2006
PDF: 13 pages
Proc. SPIE 6319, Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII, 63190V (30 August 2006); doi: 10.1117/12.679554
Show Author Affiliations
P. Paki Amouzou, Physical Optics Corp. (United States)
M. Gertsenshteyn, Physical Optics Corp. (United States)
T. Jannson, Physical Optics Corp. (United States)
P. Shnitser, Physical Optics Corp. (United States)
G. Savant, Physical Optics Corp. (United States)


Published in SPIE Proceedings Vol. 6319:
Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII
F. Patrick Doty; Larry A. Franks; Arnold Burger; H. Bradford Barber; Hans Roehrig; Ralph B. James, Editor(s)

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