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Proceedings Paper

A novel high-resolution and large-range diffractive wavefront sensor
Author(s): Yueai Liu; Laurence Warden; Keith J. Dillon; Garry Mills; Andrea W. Dreher
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Paper Abstract

Based on the Talbot self-imaging principle, a diffraction-based wavefront sensor, the Z-ViewTM wavefront sensor, has been developed at Ophthonix Inc. According to the Talbot effect, a periodic grating can be self-imaged at certain distances behind the grating, commonly known as Talbot distances, without the aid of any imaging device. The fidelity of the Talbot image to the grating pattern is affected by the wavefront aberration in the illumination beam. Therefore, the wavefront distortion can be retrieved through numerical analysis of the Talbot image. Unlike the well-known Shack-Hartmann wavefront sensor, where a group of pixels on the camera is responsible for only one wavefront data point, each camera pixel in the Z-View wavefront sensor has a corresponding wavefront data. The Z-View wavefront sensor measures the wavefront at 1024 x 1048 data points, and can achieve a dynamic range of wavefront curvature of 20 diopters. The Z-View wavefront sensor has been successfully used for wavefront sensing in ophthalmic aberrometry, adaptive optics, and lensometry at Ophthonix.

Paper Details

Date Published: 29 August 2006
PDF: 6 pages
Proc. SPIE 6306, Advanced Wavefront Control: Methods, Devices, and Applications IV, 63060J (29 August 2006); doi: 10.1117/12.679544
Show Author Affiliations
Yueai Liu, Ophthonix, Inc. (United States)
Laurence Warden, Ophthonix, Inc. (United States)
Keith J. Dillon, Ophthonix, Inc. (United States)
Garry Mills, Ophthonix, Inc. (United States)
Andrea W. Dreher, Ophthonix, Inc. (United States)


Published in SPIE Proceedings Vol. 6306:
Advanced Wavefront Control: Methods, Devices, and Applications IV
Michael K. Giles; John D. Gonglewski; Richard A. Carreras, Editor(s)

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