Share Email Print

Proceedings Paper

ZnSe(Te)-based crystals and detectors for nondestructive testing and cargo inspection
Author(s): V. P. Seminozhenko; V. D. Ryzhikov; A. D. Opolonin; O. K. Lisetska; S. N. Galkin; E. F. Voronkin; S. A. Kostyukevich
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Due to disadvantages of scintillator ZnSe(Te) - poor transparence to own emission (10-1 cm-1), long decay time, low density and Zeff-this material had no practical applications in the ranges of X-ray energies about 120-140 keV. After the development of dual energy X-ray inspection scanners, CT and digital radiography situation changed on the contrary at whole. Both theory and experiments show that now it is the best material for low energy array detectors. The pilot-industrial production of ZnSe(Te) crystals is organized, their usage in CT and inspection X-rays scanners being already started. It has become possible to get tomography imaging simultaneously with automatic recognition of dangerous objects and substances, which is due to the unique parameters of ZnSe(Te). Presently several leading western companies look for possibilities to use ZnSe(Te) for medical X-ray CT. Our aim was to unveil the nature of luminescence centers and the emission mechanism in crystals of ZnSe(Te) compounds with isovalent dopants from the results of our studies of optical, spectroscopic and kinetic characteriestics of these crystals. Basing on the obtained understanding of the emission centers, we aimed at creation of a reproducible production technology of scintillators for application in inspection and medical equipment. The research described in this publication was made possible in part by INTAS Project Ref. Nr. 05-104-7519.

Paper Details

Date Published: 21 September 2006
PDF: 8 pages
Proc. SPIE 6319, Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII, 63191B (21 September 2006); doi: 10.1117/12.679498
Show Author Affiliations
V. P. Seminozhenko, STC Institute for Single Crystals (Ukraine)
V. D. Ryzhikov, Institute of Scintillation Materials (Ukraine)
A. D. Opolonin, Institute of Scintillation Materials (Ukraine)
O. K. Lisetska, Institute of Scintillation Materials (Ukraine)
S. N. Galkin, Institute of Scintillation Materials (Ukraine)
E. F. Voronkin, Institute of Scintillation Materials (Ukraine)
S. A. Kostyukevich, Institute of Semiconductors (Ukraine)

Published in SPIE Proceedings Vol. 6319:
Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII
F. Patrick Doty; Larry A. Franks; Arnold Burger; H. Bradford Barber; Hans Roehrig; Ralph B. James, Editor(s)

© SPIE. Terms of Use
Back to Top