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Proceedings Paper

Direct wavefront phase measurement using point diffraction interferometer with application to large scale AO
Author(s): Andrew K. Kirby; Thomas J. D. Oag; Gordon D. Love
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Paper Abstract

Interferometric techniques are attractive in wavefront sensing because they give a direct measure of the phase, which means they are useful for use with a piston-only wavefront corrector (such as a liquid crystal spatial light modulator, or some MEMS mirrors). We describe a novel method of implementing a common-path phase-shifting point diffraction interferometric wavefront sensor. The sensor simultaneously gives two phase-shifted outputs which can be used to drive a phase-only wavefront corrector. The device can also give a null output which can be used to calibrate any scintillation.

Paper Details

Date Published: 29 August 2006
PDF: 6 pages
Proc. SPIE 6306, Advanced Wavefront Control: Methods, Devices, and Applications IV, 63060I (29 August 2006); doi: 10.1117/12.679441
Show Author Affiliations
Andrew K. Kirby, Durham Univ. (United Kingdom)
Thomas J. D. Oag, Durham Univ. (United Kingdom)
Gordon D. Love, Durham Univ. (United Kingdom)

Published in SPIE Proceedings Vol. 6306:
Advanced Wavefront Control: Methods, Devices, and Applications IV
Michael K. Giles; John D. Gonglewski; Richard A. Carreras, Editor(s)

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