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Proceedings Paper

Triple wavelength monitor PDIC
Author(s): Deukhee Park; Chang-woo Ha; Sang-cheol Shin; Kyoung-soo Kwon; Joo-yul Ko; Shin-jae Kang
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Paper Abstract

Recently the demand for high-capacity optical storage systems compatible with CD, DVD, and Blue is growing. We designed the Vertical NIP photodiode with a diameter of 700um and the trans-impedance circuits by using 0.6um BiCMOS process. The measured sensitivity of the photodiode is 0.25, 0.42, and 0.48A/W for 405, 650, and 780nm wavelength lights, respectively. The capacitance of the PD is 4.5pF. Monitor PDIC for detecting triple wavelength lights is presented in this paper. The complete monitor PDIC with the NIP photodiode of 700um in diameter occupies 1900um*1200um. -3dB bandwidth is 110MHz and the temperature drift of output voltage is 3.2%.

Paper Details

Date Published: 7 September 2006
PDF: 8 pages
Proc. SPIE 6294, Infrared and Photoelectronic Imagers and Detector Devices II, 62940Q (7 September 2006); doi: 10.1117/12.679332
Show Author Affiliations
Deukhee Park, Samsung Electro-Mechanics Co., Ltd. (South Korea)
Chang-woo Ha, Samsung Electro-Mechanics Co., Ltd. (South Korea)
Sang-cheol Shin, Samsung Electro-Mechanics Co., Ltd. (South Korea)
Kyoung-soo Kwon, Samsung Electro-Mechanics Co., Ltd. (South Korea)
Joo-yul Ko, Samsung Electro-Mechanics Co., Ltd. (South Korea)
Shin-jae Kang, Samsung Electro-Mechanics Co., Ltd. (South Korea)


Published in SPIE Proceedings Vol. 6294:
Infrared and Photoelectronic Imagers and Detector Devices II
Randolph E. Longshore; Ashok Sood, Editor(s)

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