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Proceedings Paper

Understanding the electronic properties of hydrogen storage materials with photon-in/photon-out soft-x-ray spectroscopy
Author(s): Jinghua Guo
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Paper Abstract

How do we learn about chemisorption and physisorption of hydrides and the kinetics of hydrogen adsorption and desorption? These are profound challenges with us for decades. Soft-x-ray spectroscopy will be will be a unique tool to study the electronic properties of fundamental materials, nanoporous, and complex hydrides and in-situ study the kinetics of hydrogen adsorption and desorption. To facilitate the search for most efficient hydrogen-generation and - storage compounds, a fundamental understanding of the electronic properties is essential. Hydrogen strongly affects the electronic and structural properties of many materials. The electronic structure ultimately determines the properties of matter. Photon-in/photon-out soft-x-ray spectroscopy has been the subject to a revived interest owing to the new generation synchrotron facilities and high performance beamline and instruments. Soft-x-ray absorption spectroscopy (XAS) probes the local unoccupied electronic structure, soft-x-ray emission spectroscopy (XES) probes the local occupied electronic structure, and resonant inelastic soft-x-ray scattering (RIXS) probes the intrinsic low-energy excitations, such as charge transfer, proton energy transfer etc. A number of examples, including some recent experimental findings, then illustrate the potential of XAS and XES applications in hydrogen energy sciences.

Paper Details

Date Published: 8 September 2006
PDF: 11 pages
Proc. SPIE 6340, Solar Hydrogen and Nanotechnology, 634006 (8 September 2006); doi: 10.1117/12.679211
Show Author Affiliations
Jinghua Guo, Lawrence Berkeley National Lab. (United States)


Published in SPIE Proceedings Vol. 6340:
Solar Hydrogen and Nanotechnology
Lionel Vayssieres, Editor(s)

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