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Proceedings Paper

A point-diffraction interferometer with vibration-desensitizing capability
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Paper Abstract

We present a new type of point-diffraction interferometer specially designed for industrial use with high immunity to external vibration encountered in the course of measurement process. The proposed interferometer uses thermally-expanded fibers instead of conventional pinholes as the point-diffraction source to obtain a high quality reference wave with an additional advantage of relatively easy alignment of optical components. Vibration desensitization is realized through a common-path configuration that allows the influence of vibration to affect both the reference and measurement waves identically so that it is subsequently cancelled out during the interference of the two waves. A spatial phase shifter is added to capture four phase-shifted interferograms simultaneously without time delay using a single camera to avoid vibration effects. Experimental results demonstrate that the proposed interferometer is capable of providing stable measurements with a level of fringe stabilization of less than 1 nanometer in a typical workshop environment equipped with no excessive ground isolation for anti-vibration.

Paper Details

Date Published: 14 August 2006
PDF: 8 pages
Proc. SPIE 6293, Interferometry XIII: Applications, 62930B (14 August 2006); doi: 10.1117/12.678691
Show Author Affiliations
Hagyong Kihm, Korea Advanced Institute of Science and Technology (South Korea)
Jungjae Park, Korea Advanced Institute of Science and Technology (South Korea)
Taekmin Kwon, Korea Advanced Institute of Science and Technology (South Korea)
Joon Ho You, Korea Advanced Institute of Science and Technology (South Korea)
Seung-Woo Kim, Korea Advanced Institute of Science and Technology (South Korea)


Published in SPIE Proceedings Vol. 6293:
Interferometry XIII: Applications
Erik L. Novak; Wolfgang Osten; Christophe Gorecki, Editor(s)

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