Share Email Print
cover

Proceedings Paper

Optical response and light scattering measurements from a planar guided wave
Author(s): Raúl García-Llamas; Aldo S. Ramírez-Duverger; Jorge Gaspar-Armenta; Raúl Aceves-Torres
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Experimental results of reflection and light scattering measurements using the technique of attenuated total reflection (ATR) in the Kretschmann configuration of a system when it is excited an electromagnetic guided mode are reported. The system used is BK7 glass-prism/Dielectric1/Dielectric2/Dielectric1/air, where the refractive index of dielectric1 is less than the refractive index of the dielectric2. It was found a dip in the specular reflection as a function of the incident angle due to the excitation of a guided mode in the dielectric2 film. The guided mode was found for s polarization of the incident light. The angular dependence of the scattered light displays a peak caused by single-scattering and located approximately at the angles of excitation of the guided modes whose normalized wave numbers are less than the refractive index of the glass. Values of thickness, refractive index and absorption index obtained from Lorentz dispersion model of the film are reported.

Paper Details

Date Published: 28 August 2006
PDF: 7 pages
Proc. SPIE 6286, Advances in Thin-Film Coatings for Optical Applications III, 62860J (28 August 2006); doi: 10.1117/12.678669
Show Author Affiliations
Raúl García-Llamas, Univ. de Sonora (Mexico)
Aldo S. Ramírez-Duverger, Univ. de Sonora (Mexico)
Jorge Gaspar-Armenta, Univ. de Sonora (Mexico)
Raúl Aceves-Torres, Univ. de Sonora (Mexico)


Published in SPIE Proceedings Vol. 6286:
Advances in Thin-Film Coatings for Optical Applications III
Michael J. Ellison, Editor(s)

© SPIE. Terms of Use
Back to Top