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Proceedings Paper

Non-contact and on-line cone diameter measuring based on high speed linear CCD
Author(s): Guohui Zhou; Jianhua Wang
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Paper Abstract

The remarkable improvement of sensing and processing hardware performance makes the non-contact, on-line, high accuracy and high speed measuring possible by means of linear CCD. The goal of this paper is to describe the key questions on designing the cone diameter detecting system by linear CCD. This paper first describes the detecting scheme. In particular, the factors affecting accuracy, such as resolution, voltage difference between neighbor pixels, detecting rate and so on, are analyzed, and the quantitative estimation equations are provided. CCD takes on the photoelectric translation and measuring component double functions, so the waveform of CCD output signal and the affecting factors merit deep discussion. On the basis of discussion, several principles that can be used to improve the boundary recognition accuracy are presented.

Paper Details

Date Published: 23 February 2006
PDF: 6 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61503D (23 February 2006); doi: 10.1117/12.678611
Show Author Affiliations
Guohui Zhou, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Chinese Academy of Sciences (China)
Harbin Normal Univ. (China)
Jianhua Wang, Harbin Normal Univ. (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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