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Proceedings Paper

Electron transfer dynamics of dye-55026 J-aggregate to AgBr grains studied by ultrafast fluorescence spectroscopy
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Paper Abstract

Direct detection of the dynamics of photo-induced electrons in AgBr photographic system sensitized by dye-55026 was performed using picosecond time-resolved fluorescence spectroscopy. The dependence of the electron transfer rate on different conditions and microcosmic mechanism of electron transfer were analyzed. The experiment setup in our work was a system of high-speed streak photography (Streak Cameras) with a time-resolution of 5 ps. With stead spectroscopy, the peak of absorption and fluorescence of J-aggregation on AgBr grains both have a red shift contrast to monomer. On the same time the absorption spectrum band of J-aggregation becomes narrow. The fluorescence decay curves of J-aggregation on both the cubic and tabular AgBr grains (T-grains) were gained with different dye concentrations. These curves are fitted well by a sum of double exponential functions, which includes a fast and a slow component. Because of large amplitudes (68-99% for T-grains and 68-80% for cubic grains) of the fast decay (2.4-12.1ps for T-grains and 4.1-5.8ps for cubic grains) and the estimated quantum yield of the electron injection, this fast decay should be mainly attributable to the electron transfer from excited J-aggregation to conduction band of AgBr. At low concentration (<4.51mmol/molAg), the fluorescence decay lifetime for T-grains is longer than that for cubic grains. As the increase of the concentration, it will become more rapidly for T-grains than that for cubic grains.

Paper Details

Date Published: 23 February 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 615034 (23 February 2006); doi: 10.1117/12.678592
Show Author Affiliations
Shaopeng Yang, Hebei Univ. (China)
Guozhi Fan, Hebei Univ. (China)
Ning Cao, Hebei Univ. (China)
Xiaowei Li, Hebei Univ. (China)
Guangsheng Fu, Hebei Univ. (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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