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Proceedings Paper

A new method of scanning image for phase objects
Author(s): Zuo-hua Huang; Feng-chao Chen
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Paper Abstract

A new method of double point sources interference scanning image for phase object is proposed in the paper. Based on the principle of the light interference, the expressions of the period and its displacement of the interference fringes have been deduced theoretically. The pictures of the fringes are gained by the CCD camera and the data are processed by the image processing technology. A gray-level image and a pseudo color image of the phase object are reconstructed. The scanning image intensity displayed by this method is linear to the phase. The phase accuracy could reaches π/10 ~ π/25, and the range of phase varies from 0 to 2π. The ray path of the experimental system is simple, and the operation is easy.

Paper Details

Date Published: 23 February 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 615030 (23 February 2006); doi: 10.1117/12.678577
Show Author Affiliations
Zuo-hua Huang, South China Normal Univ. (China)
Feng-chao Chen, South China Normal Univ. (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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