Share Email Print
cover

Proceedings Paper

Theoretical model and optimization of a novel optical fiber current sensor based on F-P resonant cavity structure and magnetostrictive effect
Author(s): Xiujuan Zhang; Yueming Liu; Liaolin Hu; Chunhong Lu; Zhenfeng Zhao
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Theoretical model and optimization of a novel optical fiber current sensor is presented, and the principle of this sensor is based on Fabry-Perot cavity multi-light interference theory and magnetostrictive effect of Tb-Dy-Fe material. This optical fiber current sensor is specially suitable in application of the hazardous high-voltage environments due to their characteristics including a dielectric nature, immunity to electro-magnetic interference, high sensitivity, non-contacted measurement feature, small size, light weight and capability of remote measurement and control. In practical application, it can be hung on a high-voltage wire and its range of measurement and sensitivity can be adjusted through modulating the distance between the sensor and the high-voltage wire. Static electromagnetic analysis is presented by means of ANSYS software, and the distribution of the magnetic field in the sensor can be gotten, which offers an effective reference for further calculation. In order to achieve a well-distributed magnetic field on capillary of Tb-Dy-Fe material, the distance between the sensor and the high-voltage wire was optimized by the finite element analysis software. The result of theoretical simulation obtained is as follows, the sensitivity is 13nw / A, while the distance between the center of high-voltage wire and transducer head is 20mm, the range of the measured current is 1000A to 8000A.

Paper Details

Date Published: 23 February 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61502V (23 February 2006); doi: 10.1117/12.678556
Show Author Affiliations
Xiujuan Zhang, Xi'an Univ. of Technology (China)
Yueming Liu, Xi'an Univ. of Technology (China)
Liaolin Hu, Xi'an Univ. of Technology (China)
Chunhong Lu, Xi'an Univ. of Technology (China)
Zhenfeng Zhao, Xi'an Univ. of Technology (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

© SPIE. Terms of Use
Back to Top