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Proceedings Paper

Dispersive interferometry using femtosecond pulse laser for measuring refractive index and physical thickness of test samples
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Paper Abstract

We present a new scheme of dispersive interferometry utilizing a femtosecond pulse laser for the dispersion-insensitive measurement of the refractive index of an optical material. Not only the group refractive index but also the variation of the phase refractive index with wavelength is determined without prior knowledge. Experiment results obtained from specimens of BK7 and UV silica are discussed.

Paper Details

Date Published: 14 August 2006
PDF: 9 pages
Proc. SPIE 6292, Interferometry XIII: Techniques and Analysis, 62920N (14 August 2006); doi: 10.1117/12.678461
Show Author Affiliations
Ki-Nam Joo, Korea Advanced Institute of Science and Technology (South Korea)
Seung-Woo Kim, Korea Advanced Institute of Science and Technology (South Korea)


Published in SPIE Proceedings Vol. 6292:
Interferometry XIII: Techniques and Analysis
Katherine Creath; Joanna Schmit, Editor(s)

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