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Proceedings Paper

Modeling particle distributions for stray light analysis
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Paper Abstract

There has been a general awareness for several years that the IEST-STD-CC1246 standard particle distribution with a slope of -0.926 does not reasonably represent the contamination on optics that have not been recently cleaned. As a result, the CL (Cleanliness Level) nomenclature actually counters effective communication and modeling of particulate contamination scatter. An analysis method and communication standard centered on Percent Areal Coverage (PAC) and particle distribution slope is presented that improves the ability of Contamination Engineering and Stray Light Engineering to tackle ever more difficult instrument stray light requirements in the most cost-effective manner. Modeling the expected particle distributions for multiple contamination species improves accuracy and reduces costly overdesign.

Paper Details

Date Published: 7 September 2006
PDF: 8 pages
Proc. SPIE 6291, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II, 62910T (7 September 2006); doi: 10.1117/12.678321
Show Author Affiliations
John Fleming, Ball Aerospace & Technologies Corp. (United States)
Bruce Matheson, Ball Aerospace & Technologies Corp. (United States)
Michael G. Dittman, Ball Aerospace & Technologies Corp. (United States)
Frank Grochocki, Ball Aerospace & Technologies Corp. (United States)
Brenda Firth, Ball Aerospace & Technologies Corp. (United States)


Published in SPIE Proceedings Vol. 6291:
Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II
O. Manuel Uy; John C. Fleming; Michael G. Dittman, Editor(s)

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