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Proceedings Paper

Current-induced frequency modulation characteristics in semiconductor lasers using a novel and simple method
Author(s): Jianhui Zhu; Min Zhang; Yanbiao Liao; Jin Tang
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Paper Abstract

In this paper, a simple method for measuring current-induced frequency modulation characteristics of semiconductor lasers is reported. In this method, no complicated optical and measuring system is needed and is easy for practical application. The experimental results in low modulation frequency range show 0.2% in accuracy is achieved and the system is fit for measuring the current-induced frequency modulation characteristics of semiconductor lasers.

Paper Details

Date Published: 14 August 2006
PDF: 6 pages
Proc. SPIE 6293, Interferometry XIII: Applications, 62930V (14 August 2006); doi: 10.1117/12.678212
Show Author Affiliations
Jianhui Zhu, Tsinghua Univ. (China)
Min Zhang, Tsinghua Univ. (China)
Yanbiao Liao, Tsinghua Univ. (China)
Jin Tang, China Oilfield Services Ltd. (China)


Published in SPIE Proceedings Vol. 6293:
Interferometry XIII: Applications
Erik L. Novak; Wolfgang Osten; Christophe Gorecki, Editor(s)

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