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Proceedings Paper

High resolution deformation measurement method using one sheet of specklegram
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Paper Abstract

A high-resolution new fringe analysis method based on Hilbert transformation is proposed by using the features of speckle interferometry. Hilbert transformation that is used widely in communication systems as the filter technology is the complex signal processing technology. And, the transformation can produce the analytic signal that has phase difference; π/2 rad. This transformation is also an effective method in fringe scanning method. In the proposed fringe scanning method for speckle interferometry in this paper, the transformation is not applied to the speckle grams, but to directly speckle patterns. The simulation based on the principle of proposed fringe analysis is performed by using the simple intensity distribution model of the speckle patterns. The validity of the principle of the method and the usefulness of the method are shown in the simulation. The experiments show that the difference between the results by the new and the ordinary methods is about 0.54 rad (1/12wave) as standard deviation.

Paper Details

Date Published: 14 August 2006
PDF: 10 pages
Proc. SPIE 6292, Interferometry XIII: Techniques and Analysis, 62921A (14 August 2006); doi: 10.1117/12.678171
Show Author Affiliations
Yasuhiko Arai, Kansai Univ. (Japan)
Shunsuke Yokozeki, Jyouko Applied Optics Lab. (Japan)


Published in SPIE Proceedings Vol. 6292:
Interferometry XIII: Techniques and Analysis
Katherine Creath; Joanna Schmit, Editor(s)

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