Share Email Print
cover

Proceedings Paper

A novel optical fiber displacement sensor of wider measurement range based on neural network
Author(s): Yuan Guo; Xue Feng Dai; Yu Tian Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

By studying on the output characteristics of random type optical fiber sensor and semicircular type optical fiber sensor, the ratio of the two output signals was used as the output signal of the whole system. Then the measurement range was enlarged, the linearity was improved, and the errors of reflective and absorbent changing of target surface are automatically compensated. Meantime, an optical fiber sensor model of correcting static error based on BP artificial neural network(ANN) is set up. So the intrinsic errors such as effects of fluctuations in the light, circuit excursion, the intensity losses in the fiber lines and the additional losses in the receiving fiber caused by bends are eliminated. By discussing in theory and experiment, the error of nonlinear is 2.9%, the measuring range reaches to 5-6mm and the relative accuracy is 2%.And this sensor has such characteristics as no electromagnetic interference, simple construction, high sensitivity, good accuracy and stability. Also the multi-point sensor system can be used to on-line and non-touch monitor in working locales.

Paper Details

Date Published: 19 May 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61501O (19 May 2006); doi: 10.1117/12.678102
Show Author Affiliations
Yuan Guo, Yan Shan Univ. (China)
Qi Qihaer Univ. (China)
Xue Feng Dai, Qi Qihaer Univ. (China)
Yu Tian Wang, Yan Shan Univ. (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

© SPIE. Terms of Use
Back to Top