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Proceedings Paper

Design of an embedded optical fiber micro-displacement measurement system
Author(s): Gang Zhang; Youping Chen; Huimin Cao
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Paper Abstract

Design of an embedded optical fiber micro-displacement measurement system is presented. It consists of an optical fiber displacement sensor, a signal pre-processing unit and an embedded microprocessor unit of ADuC812. The displacement sensor is a reflective intensity-modulated optical fiber bundle sensor with two paths of optical signal output, so influences of light resource fluctuation and other common interferences such as external environment and fiber loss are reduced. The signal pre-processing unit consists of several functional circuits, such as optical-electrical transducer, pre-amplification unit, band-pass filter and phase sensitive detection circuit, and is used to transform the two paths of optical signals mentioned above into two paths of electrical signals. ADuC812 is an advanced embedded microprocessor module with high performance and low price. In this application, it is used to accomplish functions of two paths of signals sampling, signals dividing and signal nonlinear processing, and finally output an analog voltage in proportion with the measured displacement. By introducing the embedded microprocessor module of ADuC812, the measurement performance and intelligent extent of the micro-displacement measurement system can be improved, resulting in the wide applications in advanced manufacturing and testing.

Paper Details

Date Published: 19 May 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61501M (19 May 2006); doi: 10.1117/12.678101
Show Author Affiliations
Gang Zhang, Huazhong Univ. of Science and Technology (China)
Youping Chen, Huazhong Univ. of Science and Technology (China)
Huimin Cao, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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