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Proceedings Paper

Stray light in packaged detectors
Author(s): D. M. Waters; M. M. Blouke; A. Harwit; D. Heath
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Paper Abstract

Ghosting between detector and window surfaces is a common source of stray light in packaged detectors. Simple formulas are presented for predicting window ghost characteristics. Stray light paths in silicon detectors, which are semi-transparent to near-infrared light, can involve non-optical structures deep within the device. Methods for identifying subsurface stray light paths are presented.

Paper Details

Date Published: 7 September 2006
PDF: 8 pages
Proc. SPIE 6291, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II, 62910U (7 September 2006); doi: 10.1117/12.678094
Show Author Affiliations
D. M. Waters, Ball Aerospace & Technologies Corp. (United States)
M. M. Blouke, Ball Aerospace & Technologies Corp. (United States)
A. Harwit, Ball Aerospace & Technologies Corp. (United States)
D. Heath, Ball Aerospace & Technologies Corp. (United States)


Published in SPIE Proceedings Vol. 6291:
Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II
O. Manuel Uy; John C. Fleming; Michael G. Dittman, Editor(s)

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