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Proceedings Paper

Thermal temperature measurement and dynamic analysis based on USB 2.0
Author(s): Lingxue Wang; Shiming Shi; Weiqi Jin; Kun Ding; Yuanmeng Zhao; Xia Wang
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Paper Abstract

A real-time 16-bit digital video grabber based on USB 2.0 protocol, thermal temperature measurement and dynamic analysis software are presented. One kind of 35 μm square pixel pitch's uncooled focal plane array thermal imaging module with 16-bit digital video output was selected. As long as being equipped with suitable camera lens, power supply and monitor, the module can be integrated as a thermal imaging system for observation, recognition, tracking and thermal images detection. Cypress Corp. CY7C68013 USB protocol chip is utilized. Main developments of video grabber are stressed on data transfer and logic control between imaging module and CY7C68013 with CPLD devices, and programming windows drivers based on Windriver. The measurement and dynamic analysis software involves not only traditional false color coding, point/line/area temperature analysis, but also several new functions: 1. Automatically mark and monitor the area when its temperature is higher than a setting threshold, and plot the curve of temperature histogram against time. 2. Monitor and plot the temperature movement versus time in manually setting points or area. 3. Database based on local area network convenient for sharing and managing data. Statistics form, curve plot, single-frame and sequence images can enter into database by manual operation or in term of some conditions set previously, such as files saving interval. Moreover, different functions are designed according to the authority of accessing local area network.

Paper Details

Date Published: 19 May 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61500P (19 May 2006); doi: 10.1117/12.678092
Show Author Affiliations
Lingxue Wang, Beijing Institute of Technology (China)
Shiming Shi, Beijing Institute of Technology (China)
Weiqi Jin, Beijing Institute of Technology (China)
Kun Ding, Beijing Institute of Technology (China)
Yuanmeng Zhao, Beijing Institute of Technology (China)
Xia Wang, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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