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Proceedings Paper

Study on precise measurement of high reflectivity by cavity ring-down spectroscopy
Author(s): Gang Ren; Bang-wei Cai; Bin Zhang; Sheng-ming Xiong; Wei Huang; Li-feng Gao
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Paper Abstract

Using cavity ring-down spectroscopy technique, the precise measurement device for the high reflectivity at 1.315μm has been built. Tested reflectivity of high-reflecting mirror is as high as 99.979%. The precision of measurement is at the 10-5 level. For further investigation, some factors such as the instability of laser source, the cavity length, the diaphragm aperture and detector position, the mode match, the reflectivity of cavity mirror, which may affect the precision of measurement are studied. Our study will provide a theoretical and experimental reference for further improvement of the measuring accuracy.

Paper Details

Date Published: 19 May 2006
PDF: 6 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61500O (19 May 2006); doi: 10.1117/12.678091
Show Author Affiliations
Gang Ren, Sichuan Univ. (China)
Bang-wei Cai, Sichuan Univ. (China)
Bin Zhang, Sichuan Univ. (China)
Sheng-ming Xiong, Institute of Optics and Electronics, CAS (China)
Wei Huang, Institute of Optics and Electronics, CAS (China)
Li-feng Gao, Institute of Optics and Electronics, CAS (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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