Share Email Print
cover

Proceedings Paper

Novel techniques for random depth access three-dimensional white-light optical metrology
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Digital stepping is desirable in optical metrology--operation is simple, absolute position is known, and random regions of interest can be skipped to, rapidly and accurately. However, in white-light interferometry, analog scanning has traditionally been employed because, in one operation, it achieves depth scanning of a sample and an electronically detectable optical carrier through a Doppler shift. This is not obligatory nor efficient in functional machine vision, especially if approximate preknowledge of the sample exists. Two methods, utilizing digital depth stepping and a superluminescent diode, are presented to decouple optical carrier generation from depth scanning in full-field white-light interferometry. One technique employs a complementary metal-oxide semiconductor camera and acousto-optic modulation to generate a frequency difference between two arms of a Mach--Zehnder interferometer. The other technique uses a Michelson interferometer with a piezoelectric transducer integrated to the digital stepper motor to facilitate 2λ analog scanning and an optical carrier of 4 periods, sampled with a standard charge-coupled device camera. In the former case, random depth access measurement of an engineering gauge block calibration sample is presented, while the latter demonstrates the application of the random depth access full-field white-light interferometry to a small punch test. A further benefit of these techniques is the possibility of interferometric phase retrieval on condition of path length matching; this is proven by the implementation of a heterodyne phase retrieval algorithm in the gauge block measurement. Both techniques represent an advance in optical metrology, offering an inexpensive and functional solution to machine vision and industrial measurement applications.

Paper Details

Date Published: 14 August 2006
PDF: 12 pages
Proc. SPIE 6292, Interferometry XIII: Techniques and Analysis, 629212 (14 August 2006); doi: 10.1117/12.678061
Show Author Affiliations
Patrick Egan, Univ. of Limerick (Ireland)
European Commission Joint Research Ctr. (Italy)
Fereydoun Lakestani, European Commission Joint Research Ctr. (Italy)
Maurice P. Whelan, European Commission Joint Research Ctr. (Italy)
Michael J. Connelly, Univ. of Limerick (Ireland)


Published in SPIE Proceedings Vol. 6292:
Interferometry XIII: Techniques and Analysis
Katherine Creath; Joanna Schmit, Editor(s)

© SPIE. Terms of Use
Back to Top