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Proceedings Paper

Measurement of low loss and mirrors’ reflectivity using cavity ring down spectroscopy with high accuracy
Author(s): Dexing Yang; Yajun Jiang; Jianlin Zhao; Nan Di
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Paper Abstract

Differential laser gyro is an ideal equipment to solve the "lock-in" behavior. The ring cavity must be low loss and the reflectivity of mirrors in gyro must be more than 99.99%. But the insertion of a piece of quartz glass and a Faraday cell in the cavity will broaden the "lock-in" area due to additional loss, so it is very important to measure ultra-high reflectivity of mirrors and the loss of transparent glass plate used in gyro. 632.8nm He-Ne laser is the most suitable light to travel around the ring cavity in gyro, so the traditional cavity ring down spectroscopy (CRDS) must be improved by using continuous-wave (CW) He-Ne laser instead of pulsed one. The results show that the single-pass loss through the glass plate can be kept below 3.0×10-11cm-1. Using combination of linear and folded cavity ring down spectroscopy, the loss such as absorption of gas in the cavity are counteracted due to the equalized length of cavity, so the reflectivity of the mirrors is measured with high accuracy. The ring down time of the cavity with and without a sample is obtained respectively, and then the total loss of the measured sample is calculated. The results show that the improved CRDS is suitable for accurately measuring low loss of medium and reflectivity of mirrors.

Paper Details

Date Published: 19 May 2006
PDF: 7 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 615007 (19 May 2006); doi: 10.1117/12.677964
Show Author Affiliations
Dexing Yang, Northwestern Polytechnical Univ. (China)
Yajun Jiang, Northwestern Polytechnical Univ. (China)
Jianlin Zhao, Northwestern Polytechnical Univ. (China)
Nan Di, Northwestern Polytechnical Univ. (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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