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Proceedings Paper

Inverted SP resonance in palladium in Kretchmann configuration
Author(s): P. Kohns; E. I. Logacheva; V. S. Makin; Yu. I. Pestov
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Paper Abstract

The surface plasmon resonance in Kretchmann configuration showing reflectivity maxima in thin palladium films has been discovered and investigated. The resonant curve form and angular position are influenced by thin film palladium whose properties (the frequency of nonelastic electron collisions in metal (γ) and the metal electron plasma frequency (ωp)) depend on concentration of hydrogen in ambient medium. It is shown that by increasing the γ value and decreasing the ωp value the resonant curve half-width broadens. Behavior of reflected beam phase as functions of γ and ωp was simulated. It is shown that inverted resonance for surface plasmons for palladium may be used for wide class of SP-based sensors, in particular, for sensors of small hydrogen concentration.

Paper Details

Date Published: 9 June 2006
PDF: 7 pages
Proc. SPIE 6251, Lasers for Measurements and Information Transfer 2005, 625118 (9 June 2006); doi: 10.1117/12.677895
Show Author Affiliations
P. Kohns, Diospec (Germany)
E. I. Logacheva, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)
V. S. Makin, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)
Yu. I. Pestov, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)


Published in SPIE Proceedings Vol. 6251:
Lasers for Measurements and Information Transfer 2005
Vadim E. Privalov, Editor(s)

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