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Proceedings Paper

Linear optics in the second-order characterization of thin films
Author(s): Stefano Cattaneo; Katja Miettinen; Elina Vuorimaa; Aleksandre Efimov; Helge Lemmetyinen; Martti Kauranen
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Paper Abstract

We study the importance of the linear optical properties of Langmuir-Blodgett films in their second-order nonlinear optical characterization. Second-harmonic generation with two noncollinear input beams is used to determine the susceptibility tensor of films of various thicknesses. In all cases, we find that the consistency of the results requires that the linear properties of the nonlinear layer be included in the model. While this is expected for the thickest films (~100 nm), our results show that the same holds also for a single Langmuir monolayer (~2,5 nm). Contrary to previous experiments on similar samples, we find that the linear response of a monolayer is well described by using the refractive index ofthick films of ~100 nm.

Paper Details

Date Published: 14 June 2006
PDF: 9 pages
Proc. SPIE 6259, ICONO 2005: Nonlinear Optical Phenomena, 62590K (14 June 2006); doi: 10.1117/12.677882
Show Author Affiliations
Stefano Cattaneo, Tampere Univ. of Technology (Finland)
Katja Miettinen, Tampere Univ. of Technology (Finland)
Elina Vuorimaa, Tampere Univ. of Technology (Finland)
Aleksandre Efimov, Tampere Univ. of Technology (Finland)
Helge Lemmetyinen, Tampere Univ. of Technology (Finland)
Martti Kauranen, Tampere Univ. of Technology (Finland)


Published in SPIE Proceedings Vol. 6259:
ICONO 2005: Nonlinear Optical Phenomena
Konstantin Drabovich; Vladimir Makarov; Yuen-Ron Shen, Editor(s)

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