Share Email Print
cover

Proceedings Paper

Two-dimensional measurement of optical parameters using inverse source problem and phase-shifting technique: optical scheme modeling
Author(s): Georgi Stoilov
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The inverse source problem is solved by utilization of reverse Fourier transformation of the light, transmitted through the object. Phase-shifting technique for obtaining the information on the phase distribution during measurement is proposed. This allows calculation of the transmission coefficient and phase delay in every point of the object. The incorporation of a reference measurement eliminates the influence of the measurement system parameters. The theoretical background is shown. A computer simulation of the influence of the more important factors of the optical scheme on the accuracy is presented. Simulation is done for different positions of the basic optical elements and inexact phase shifting. Different ADC resolutions are simulated too. Conditions and limits of measurement are discussed. This technique could be used in measurement and qualification of small and micro objects in biology.

Paper Details

Date Published: 9 June 2006
PDF: 5 pages
Proc. SPIE 6252, Holography 2005: International Conference on Holography, Optical Recording, and Processing of Information, 625224 (9 June 2006); doi: 10.1117/12.677289
Show Author Affiliations
Georgi Stoilov, Central Lab. of Optical Storage and Processing of Information (Bulgaria)


Published in SPIE Proceedings Vol. 6252:
Holography 2005: International Conference on Holography, Optical Recording, and Processing of Information
Yury Denisyuk; Ventseslav Sainov; Elena Stoykova, Editor(s)

© SPIE. Terms of Use
Back to Top