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Proceedings Paper

Image measurement of micro-hole with linear CCD
Author(s): Wenjun Wu; Bangxing Shen; Gang Shen; Shenghuai Wang; Feng Xie
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Paper Abstract

It is difficult to measure micro-hole by means of project or light-sectioning. Irradiated by the collimated laser beam, a hole less than 0.5mm will result in an Airy spot because of diffraction, the Airy spot is measured by linear array CCD. A solution was given to define the diffusion state of diffraction image's edge, and two mathematical methods was presented to calculate inspection results in this paper. The first method is to integrate optoelectric signals from scanning sample spots, and the other is to calculate digital data with least square method by computer. Thus, the detection accuracy has been improved obviously.

Paper Details

Date Published: 23 February 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 615057 (23 February 2006); doi: 10.1117/12.676934
Show Author Affiliations
Wenjun Wu, Hubei Univ. of Technology (China)
Bangxing Shen, Hubei Univ. of Technology (China)
Gang Shen, Huazhong Univ. of Science and Technology (China)
Shenghuai Wang, Hubei Univ. of Technology (China)
Feng Xie, Hubei Univ. of Technology (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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