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Proceedings Paper

Development of a surface respond parameters measurement of low responsibility detector
Author(s): Xianzhong Jian; Fu Zhao; Zipei Ju
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Paper Abstract

A new detecting system of low responsibility detector surface respond is introduced. The testing principle of detector surface respond detecting by laser modulation is given. The instrument consists of a modulation laser, focusing optical system, a week current amplifying circuit, two dimensions movement flat, the data acquisition, computer interface circuit and related software. The critical part of instrument is a focusing optics system with φ5mm aperture and a narrow frequency amplification with 1 MHz frequency. The interface chip of USB is CY7C68013-128TQPF which controls the sampling of the signal and disposing data. The CPLD controls modulating laser, FIFO time and two dimension flat. The result of experiment indicates that the system offers an excellent way for selecting detector of good characteristic and analyzing detectors' respond characteristic. Also it can be used to detect manufacturing, apply heat detector and analyze characteristic of heat detector fields.

Paper Details

Date Published: 19 May 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61502C (19 May 2006); doi: 10.1117/12.676887
Show Author Affiliations
Xianzhong Jian, Univ. of Shanghai for Science and Technology (China)
Fu Zhao, Univ. of Shanghai for Science and Technology (China)
Zipei Ju, Univ. of Shanghai for Science and Technology (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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