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Proceedings Paper

An application of wavelet transform to speckle correlation measurement
Author(s): Wei Zhao; Yang Liu; Chang Wen Liu; Hong Li Wu; Zheng Liang Li
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Paper Abstract

When applying speckle correlation measurement to the study on the displacement and deformation of objects, a very strict position accuracy of the correlated peak is required, but the correlated peak acquired from speckle frequency-domain correlation is not sharp enough, thus affecting the measurement accuracy directly. In the paper, a wavelet preprocess method for the speckle image is presented. By this means, the speckle edge character is firstly extracted, and the correlation calculation is then performed, and the correlated peak is sharpened. The computer simulated result indicates that the correlated peak can be sharpened and enhanced, and the signal-to-noise ratio is also heightened.

Paper Details

Date Published: 23 February 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 615051 (23 February 2006); doi: 10.1117/12.676864
Show Author Affiliations
Wei Zhao, Xi'an Research Institute of High-Tech (China)
Yang Liu, Xi'an Research Institute of High-Tech (China)
Chang Wen Liu, Xi'an Research Institute of High-Tech (China)
Hong Li Wu, Xi'an Research Institute of High-Tech (China)
Zheng Liang Li, Xi'an Research Institute of High-Tech (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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