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Proceedings Paper

The technique of measuring absolute spectral responsivity of InGaAs detector based on cryogenic radiometer
Author(s): Jihong Fan; Zhaoji Yang; Xiqi Hou; Yan Qin; Zhengqi Li
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Paper Abstract

The spectral responsivity is one of the important parameters of detector. With the development of infrared detect technique, infrared detector need to be better and better, so measuring the absolute spectral responsivity accurately is very important. This paper mainly introduces how to measure the absolute spectral responsivity of InGaAs detector precisely and make the measurement be based on cryogenic radiometer.We use cavity pyroelectric detector whose relative spectral responsivity should be measured ahead of time to calibrate the relative spectral responsivity of InGaAs detector in serial wavelength by means of establishing infrared spectral responsivity facility. Then we make use of silicon detector to calibrate the absolute spectral responsivity of InGaAs detector at 900nm.The silicon detector absolute spectral responsivity at 900nm is calibrated by cryogenic radiometer in association with visible spectral responsivity facility. So the absolute spectral responsivity of InGaAs detector at every wavelength can be get by calculating. At last the paper gives the measuring result and analyzes the uncertainty.

Paper Details

Date Published: 23 February 2006
PDF: 6 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 615050 (23 February 2006); doi: 10.1117/12.676863
Show Author Affiliations
Jihong Fan, Xi'an Institute of Applied Optics (China)
Zhaoji Yang, Xi'an Institute of Applied Optics (China)
Xiqi Hou, Xi'an Institute of Applied Optics (China)
Yan Qin, Xi'an Institute of Applied Optics (China)
Zhengqi Li, Xi'an Institute of Applied Optics (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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