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Proceedings Paper

Investigation of absolute measurement in quantum efficiency of photoelectric detectors by means of correlated photons
Author(s): Yu Feng; Xiaobing Zheng; Yanli Qiao; Jianjun Li
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Paper Abstract

There are two general methods for radiometric calibration of detectors. One is based on radiometric sources and the other is based on detectors. Because two methods need to establish primary standard of high precision and transfer chain of standard, the precision of standard will be reduced by extension of the chain. An absolute calibration of quantum efficiency of detectors can be realized by using correlated photons generated in spontaneous parametric down-conversion (SPDC) effect of nonlinear crystal. Generation mechanism of SPDC is interpreted with theories of quantum mechanics and classical theories. The theory of calibration based correlated photons are demonstrated. The project for proof of principle of absolute calibration of quantum efficiency of radiometric detectors is given in this paper. Comparing with traditional methods, the advantages of it are pointed out. A scheme using to calibrate quantum efficiency of infrared detectors is described here. The measurement of spatial and spectral response of detectors is mentioned too.

Paper Details

Date Published: 23 February 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 615052 (23 February 2006); doi: 10.1117/12.676834
Show Author Affiliations
Yu Feng, Anhui Institute of Optics and Fine Mechanics (China)
Xiaobing Zheng, Anhui Institute of Optics and Fine Mechanics (China)
Yanli Qiao, Anhui Institute of Optics and Fine Mechanics (China)
Jianjun Li, Anhui Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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