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Proceedings Paper

High-resolution and high-speed rotary Fourier transform spectrometer
Author(s): Xiaoxu Yang; Sizhong Zhou; Qunbo Lu; Bin Xiangli; Renkui Zhou
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Paper Abstract

Rotary Fourier Transform Spectrometer (RFTS) contains a rotary refractor, which produces continuous variational optical path difference (OPD). This specialty makes RFTS suitable to high speed spectrum measuring. Maximal OPD can increase so easily through increasing maximal sampling angle from which the system can get high resolution reconstructed spectrum also. Depending on rotating refractor to produce OPD brings some important advantages such as good immunity to outside influences, light weight, small size, etc. The basic theory of this new kind of spectrogram measuring instrument is introduced. OPD is the most important aspect to be considered in studying or designing a Fourier Transform spectrometer(FTS) system. OPD formulas of RFTS are deduced. RFTS has nonlinearity of OPD, which brings interferogram periodicity drifting and reconstructed spectrum noise. The index of OPD nonlinearity is defined and important aspects of nonlinearity are analyzed, including relationships with the refractor's refractive index and the rotating angle. Replacing OPD in Fourier Transform with nonlinear OPD of RFTS can buck the error of nonlinear OPD in reconstructed spectrum, and computer simulation shows the method effective.

Paper Details

Date Published: 23 February 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61504X (23 February 2006); doi: 10.1117/12.676756
Show Author Affiliations
Xiaoxu Yang, Xi'an Institute of Optics and Precision Mechanics (China)
Sizhong Zhou, Xi'an Institute of Optics and Precision Mechanics (China)
Qunbo Lu, Xi'an Institute of Optics and Precision Mechanics (China)
Bin Xiangli, Xi'an Institute of Optics and Precision Mechanics (China)
Renkui Zhou, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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