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Proceedings Paper

Single-beam two-photon recording and one-photon fluorescent reading three-dimensional optical data storage system
Author(s): Huohong Tang; Hui Xing; Bing Jiang; Jianwen Cai; Wenhao Huang; Andong Xia
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Paper Abstract

A scheme of three-dimensional optical data storage based on single-beam femotsecond (fs) laser two-photon recording and one-photon fluorescent readout has been developed. A mode-locked Ti: sapphire fs laser beam of pulse width 80fs at a repetition rate of 80MHz and a wavelength of 800nm was used for two-photon recording and a CW laser with a wavelength of 532nm was used for one-photon fluorescent readout. Thus, data bits can be recorded and retrieved inside a photochromic molecule doped polymethylmethacrylate (PMMA) storage medium. With a 0.65 NA objective used for recording and readout, the effects of writing power and exposure time on the spatial resolution of the system were explored. Bit sizes were observed to increase exponentially in size with excitation power and linearly in size with exposure time approximately. The multilayer capability of the system for three-dimensional optical memory was demonstrated and experimental results of eight-layer data inside a diarylethene derivative doped PMMA storage medium were presented.

Paper Details

Date Published: 23 February 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61504U (23 February 2006); doi: 10.1117/12.676735
Show Author Affiliations
Huohong Tang, Univ. of Science and Technology of China (China)
Hefei Univ. of Technology (China)
Hui Xing, Univ. of Science and Technology of China (China)
Bing Jiang, Univ. of Science and Technology of China (China)
Jianwen Cai, Univ. of Science and Technology of China (China)
Wenhao Huang, Univ. of Science and Technology of China (China)
Andong Xia, Univ. of Science and Technology of China (China)
Institute of Chemistry (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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